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Topmetal-II-: a direct charge sensor for high energy physics and imaging applications

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成果类型:
期刊论文、会议论文
作者:
Gao, C.;Huang, G.*;Sun, X.
通讯作者:
Huang, G.
作者机构:
[Huang, G.; Gao, C.; Sun, X.; Topmet Design Team] Cent China Normal Univ, Dept Phys Sci & Technol, Wuhan 430079, Hubei, Peoples R China.
通讯机构:
[Huang, G.] C
Cent China Normal Univ, Dept Phys Sci & Technol, Wuhan 430079, Hubei, Peoples R China.
语种:
英文
关键词:
Electronic detector readout concepts (solid-state);Front-end electronics for detector readout
期刊:
Journal of Instrumentation
ISSN:
1748-0221
年:
2016
卷:
11
期:
1
页码:
C01053-
会议名称:
Topical Workshop on Electronics for Particle Physics (TWEPP)
会议时间:
SEP 28-OCT 02, 2015
会议地点:
Lisbon, PORTUGAL
会议主办单位:
[Gao, C.;Huang, G.;Sun, X.;Topmet Design Team] Cent China Normal Univ, Dept Phys Sci & Technol, Wuhan 430079, Hubei, Peoples R China.
出版地:
TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
出版者:
IOP PUBLISHING LTD
机构署名:
本校为第一且通讯机构
院系归属:
物理科学与技术学院
摘要:
Topmetal-II-, a direct charge sensor, was manufactured in an XFAB 350 nm CMOS process. The Topmetal-II- sensor features a 72 x 72 pixel array with an 83 μm pixel pitch which collects and measures charge directly from the surrounding media. We introduce the implementation of the circuitry in the sensor including an analogue readout channel and a column based digital readout channel. The analogue readout channel allows the access to the full waveform from each pixel through a time-shared multiplexing. The digital readout channel records hits ide...

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