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In-plane aligned YBCO tape on textured YSZ buffer layer deposited on stainless steel substrate by laser ablation only with O+ ion beam assistance

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成果类型:
期刊论文
作者:
Huang, XT*;Wang, YQ;Wang, QL;Chen, QM
通讯作者:
Huang, XT
作者机构:
[Wang, YQ; Huang, XT; Chen, QM; Wang, QL] National Lab. of Laser Technology, Huazhong Univ. of Sci., and Technol., Wuhan, 430074, China
[Huang, XT] Department of Physics, Central China Normal University, Wuhan, 430079, China
通讯机构:
[Huang, XT ]
Huazhong Univ Sci & Technol, Natl Lab Laser Technol, Wuhan 430074, Peoples R China.
语种:
英文
期刊:
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
ISSN:
1862-6300
年:
1999
卷:
174
期:
2
页码:
R11-R12
机构署名:
本校为其他机构
院系归属:
物理科学与技术学院
摘要:
Based on the mechanism of film growth in IBAD, it is demonstrated that the energetics and the inertness of the assisting ions are crucial for the in-plane textured microstructures of the depositing YSZ films, the size and the mass of assisting ion beam being not. When the O+ ion beam energy is increased to 500 eV and an electrode of electrons is placed in the path of the O+ ion beam to neutralize the O+ ions, the textured YSZ buffer layer on stainless steel substrate can be obtained. Then, a high critical current density and in-pla...

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