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Electrical Resistance Measurement of an Individual Carbon Nanotube

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成果类型:
期刊论文
作者:
Liu, JP;Xiao, CY;Huang, XT*
通讯作者:
Huang, XT
作者机构:
[Huang, XT] Cent China Normal Univ, Coll Phys Sci & Technol, Wuhan 430079, Peoples R China.
Chinese Acad Sci, Wuhan Inst Phys & Math, Wuhan 430071, Peoples R China.
通讯机构:
[Huang, XT] C
Cent China Normal Univ, Coll Phys Sci & Technol, Wuhan 430079, Peoples R China.
语种:
英文
关键词:
电阻测量;碳纳米管;临界值;电子循环分布;薄膜物理学
期刊:
中国物理快报:英文版
ISSN:
0256-307X
年:
2005
卷:
22
期:
2
页码:
450-453
基金类别:
Supported by the National Natural Science Foundation of China
机构署名:
本校为第一且通讯机构
院系归属:
物理科学与技术学院
摘要:
Aiming at the difficulty in the electrical resistance measurement, we develop a simple statistical model for the carbon nanotubes adequately dispersed in available insulated liquid and introduce the concept of ``the most probability''. Based on this model, we obtain the function between macroscopic resistance R and resistance of an individual nanotube, R0, from which one can calculate the resistance of an individual nanotube by measuring the macroscopic resistance. By computational simulation, we prove the reliability of the model. The...

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