期刊论文

Tang, Y. W.（唐一文）

英文

Materials Science in Semiconductor Processing

1369-8001

2015

29

262-271

10.1016/j.mssp.2014.04.019

Fig. 1 shows XRD patterns of MnO2 and CuBi2O4-doped MnO2 thin films prepared by CBD on ITO glass and Ti foil. The results were shown respectively in Fig. 1a and b for CuBi2O4 doped-MnO2 with 0.00, 0.01, 0.03 and 0.05 g concentration on ITO glass and Ti foil. The intensive diffraction peaks appearing at 2θ=28.83°, 37.54°, 41.94°, 49.84°, 52.94° and 65.29° were indexed to the alpha-MnO2 [JCPDS card no. 44-141] and at 2θ=51.55° and 6178° were indexed to MnO2 [JCPDS card no. 12-713]. The peaks

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Manganese dioxide (MnO2) and CuBi2O4-doped MnO2 thin films with different nanostructures were deposited on indium tin oxide (ITO) glass and Ti foil substrates by using a chemical bath deposition (CBD) technique. The samples were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and X-ray photoelectron microscopy (XPS). The effects of doping and substrates on electrochemical properties of MnO2and CuBi2O4-doped MnO2 thin films on ITO glass and Ti foil were investigated. Capacitive properties of MnO2 and CuBi2O4-doped MnO2 thin films electrodes were studied using cyclic...