In the device source identification task, there is a lot of redundant information in the traditional MFCC, GSV and i-vector features, which affects the accuracy of device source identification. In this paper, in order to extract the key information from the device source, we propose a multi-feature fusion attention mechanism network to achieve improved accuracy. First, the multi-feature fusion attention mechanism network we proposed directly compresses the MFCC, GSV and i-vector features that characterize the source of the device using convolut...