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Restoration of collection-mode scanning near-field optical microscope image

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成果类型:
期刊论文、会议论文
作者:
Li, ZY*;Li, XF;Liu, W
通讯作者:
Li, ZY
作者机构:
[Li, XF; Liu, W; Li, ZY] Huazhong Normal Univ, Dept Phys, Wuhan 430079, Peoples R China.
通讯机构:
[Li, ZY] H
Huazhong Normal Univ, Dept Phys, Wuhan 430079, Peoples R China.
语种:
英文
关键词:
SNOM;image restoration;over restoration
期刊:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN:
0277-786X
年:
1999
卷:
3607
页码:
146-157
会议名称:
Scanning and Force Microscopies for Biomedical Applications
会议论文集名称:
Scanning and Force Microscopies for Biomedical Applications
会议时间:
San Jose, CA, United States
会议赞助商:
IBOS; SPIE
主编:
Eiichi Tamiya<&wdkj&>Shuming Nie
机构署名:
本校为第一且通讯机构
院系归属:
物理科学与技术学院
摘要:
Recently we have derived the angular spectrum transfer function (ASTF) for photon scanning tunneling microscope and collection mode scanning near field optical microscope (collection-SNOM) under dark illumination (Proc. SPIE, Vol. 3467, 23 to approximately 33). The present paper discussed image restoration using the ASTF. It was found that the key to achieve better restoration is to find a ASTF as close to that of the system as possible, which then depends on the determination of tip size, tip sample distance, incident angle of illuminating laser beam, etc. When low values are used for tip dia...

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