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Scanning near-field optical microscope with a superfluorescent source

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成果类型:
期刊论文、会议论文
作者:
Zhang, GP*张国平);Ming, H;Xie, JP
通讯作者:
Zhang, GP(张国平
作者机构:
[Zhang, GP; Ming, H; Xie, JP] Cent China Normal Univ, Dept Phys, Wuhan 430079, Peoples R China.
通讯机构:
[Zhang, GP] C
Cent China Normal Univ, Dept Phys, Wuhan 430079, Peoples R China.
语种:
英文
关键词:
near-field optics;microscope;scanning near-field optical microscope;fiber probe;superfluorescence
期刊:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN:
0277-786X
年:
1999
卷:
3740
页码:
331-334
会议名称:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
会议论文集名称:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
会议时间:
Yokohama, Japan
主编:
Ichirou Yamaguchi
机构署名:
本校为第一且通讯机构
院系归属:
物理科学与技术学院
摘要:
A superfluorescent source used for scanning near-field optical microscope (SNOM) has been developed in this paper. The superfluorescent source originates from an amplified spontaneous emission (ASE) produced by an Er-doped fiber, with a relatively wide spectrum from 1531 nm to 1537 nm. This kind of superfluorescent fiber probe has relatively high photon flux over an ordinary probe. Different image qualities are obtained by the SNOM system with the superfluorescent source and the laser source respectively. Experimental result shows that the coherent noise of th...

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