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Parameter optimization of software reliability growth model with S-shaped testing-effort function using improved swarm intelligent optimization

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成果类型:
期刊论文
作者:
Jin, Cong*;Jin, Shu-Wei
通讯作者:
Jin, Cong
作者机构:
[Jin, Cong] Cent China Normal Univ, Sch Comp, Wuhan 430079, Peoples R China.
[Jin, Shu-Wei] Ecole Normale Super, Dept Phys, 24 Rue Lhomond, F-75231 Paris 5, France.
通讯机构:
[Jin, Cong] C
Cent China Normal Univ, Sch Comp, Wuhan 430079, Peoples R China.
语种:
英文
关键词:
Software reliability growth model;S-shaped testing-effort function;Parameter optimization;Quantum particle swarm optimization;Software testing
期刊:
Applied Soft Computing
ISSN:
1568-4946
年:
2016
卷:
40
页码:
283-291
机构署名:
本校为第一且通讯机构
院系归属:
计算机学院
摘要:
Software reliability growth model (SRGM) with testing-effort function (TEF) is very helpful for software developers and has been widely accepted and applied. However, each SRGM with TEF (SRGMTEF) contains some undetermined parameters. Optimization of these parameters is a necessary task. Generally, these parameters are estimated by the Least Square Estimation (LSE) or the Maximum Likelihood Estimation (MLE). We found that the MLE can be used only when the software failure data to satisfy some assumptions such as to satisfy a certain distributio...

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